1551 search results - page 63 / 311 » Elastic Vector Time |
108
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MTV
2007
IEEE
15 years 8 months ago
2007
IEEE
Test vector ordering is recognized as a simple and non-intrusive approach to assist test power reduction. Simulation based test vector ordering approach to minimize circuit transit...
121
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VTS
2000
IEEE
15 years 6 months ago
2000
IEEE
Excessive switching activity during scan testing can cause average power dissipation and peak power during test to be much higher than during normal operation. This can cause prob...
121
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EUROSYS
2008
ACM
15 years 11 months ago
2008
ACM
Non-uniform utilization of functional units in combination with hardware mechanisms such as clock gating leads to different power consumptions in different parts of a processor ch...
113
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ISVLSI
2007
IEEE
15 years 8 months ago
2007
IEEE
Abstract— Time-to-Market plays a central role on System-ona-Chip (SoC) competitiveness and the quality of the final product is a matter of concern as well. As SoCs complexity in...
126
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VISUALIZATION
2003
IEEE
15 years 7 months ago
2003
IEEE
In this paper we present an interactive texture-based technique for visualizing three-dimensional vector fields. The goal of the algorithm is to provide a general volume renderin...