257 search results - page 36 / 52 » Electronic circuit reliability modeling |
ATAL
2010
Springer
13 years 10 months ago
2010
Springer
This paper concerns the problem of agent trust in an electronic market place. We maintain that agent trust involves making decisions under uncertainty and therefore the phenomenon...
ISQED
2008
IEEE
14 years 4 months ago
2008
IEEE
The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or vo...
DAC
2007
ACM
14 years 10 months ago
2007
ACM
An effective method for focusing optimization effort on the most important parts of a design is to examine those elements on the critical path. Traditionally, the critical path is...
DAC
2012
ACM
12 years 7 days ago
2012
ACM
Due to the large geometry of through-silicon-vias (TSVs) and their connections to the power grid, significant current crowding can occur in 3D ICs. Prior works model TSVs and pow...
FPGA
2009
ACM
14 years 4 months ago
2009
ACM
Aggressive scaling increases the number of devices we can integrate per square millimeter but makes it increasingly difficult to guarantee that each device fabricated has the inte...