257 search results - page 47 / 52 » Electronic circuit reliability modeling |
DAC
2006
ACM
14 years 10 months ago
2006
ACM
As VLSI technology scales toward 65nm and beyond, both timing and power performance of integrated circuits are increasingly affected by process variations. In practice, people oft...
ISLPED
2010
ACM
13 years 10 months ago
2010
ACM
The unique and unpredictable nature of silicon enables the use of physical unclonable functions (PUFs) for chip identification and authentication. Since the function of PUFs depen...
WWW
2005
ACM
14 years 10 months ago
2005
ACM
The recent evolution of Internet, driven by the Web services technology, is extending the role of the Web from a support of information interaction to a middleware for B2B interac...
IFIP
2001
Springer
14 years 2 months ago
2001
Springer
Effective security management depends upon good risk management, which is itself based upon a reliable risk assessment, involving data collection of all the facets influencing sys...
JPDC
2000
13 years 9 months ago
2000
: SIMD arrays are likely to become increasingly important as coprocessors in domain specific systems as architects continue to leverage RAM technology in their design. The problem ...