257 search results - page 5 / 52 » Electronic circuit reliability modeling |
ICCAD
2006
IEEE
14 years 6 months ago
2006
IEEE
Electronic energy disorder associated within amorphous and polycrystaline molecular organic thin film structures strongly affects the macroscopic observable behavior of organic fi...
ICES
2003
Springer
14 years 3 months ago
2003
Springer
In this paper, we show how artificial evolution can be used to improve the fault-tolerance of electronic circuits. We show that evolution is able to improve the fault tolerance of...
ASPDAC
1999
ACM
14 years 2 months ago
1999
ACM
- We describe an integrated model of the hardware and the battery sub-systems in batterypowered VLSI systems. We demonstrate that, under this model and for a fixed operating voltag...
CF
2004
ACM
14 years 3 months ago
2004
ACM
This paper presents a fault tolerant design technique for the clockless wave pipeline. The specific architectural model investigated in this paper is the two-phase clockless asyn...
ASPDAC
2001
ACM
14 years 1 months ago
2001
ACM
Abstract-- We propose a method of correlating circuit performance with technology fluctuations during the circuit-design phase. The method employs test circuits sensitive for techn...