257 search results - page 9 / 52 » Electronic circuit reliability modeling |
ASPDAC
2007
ACM
14 years 1 months ago
2007
ACM
Single-walled carbon nanotube (SWCNT) bundles have the potential to provide an attractive solution for the resistivity and electromigration problems faced by traditional copper int...
ISCC
2005
IEEE
14 years 3 months ago
2005
IEEE
We report an innovative solely optical architecture to implement the centralized wavelength conversion module of the CWC (Controlled Wavelength Conversion) protocol [1]. The propo...
ICCAD
2003
IEEE
14 years 6 months ago
2003
IEEE
This paper introduces a CAD framework for co-simulation of hybrid circuits containing CMOS and SET (Single Electron Transistor) devices. An improved analytical model for SET is al...
ESCIENCE
2007
IEEE
14 years 4 months ago
2007
IEEE
The electronics design industry is facing major challenges as transistors continue to decrease in size. The next generation of devices will be so small that the position of indivi...
PRDC
2008
IEEE
14 years 4 months ago
2008
IEEE
Advancements in technology enable integration of a large number of cores on a single silicon die. At the same time, aggressive technology scaling has an ever-increasing adverse im...