67 search results - page 3 / 14 » Embedded Deterministic Test for Low-Cost Manufacturing Test |
ICCD
1999
IEEE
13 years 11 months ago
1999
IEEE
If a system-on-a-chip (SOC) contains an embedded processor, this paper presents a novel approach for using the processor to aid in testing the other components of the SOC. The bas...
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
—More and more processor manufacturers have launched embedded multicore processors for consumer electronics products because such processors provide high performance and low powe...
SAC
2008
ACM
13 years 7 months ago
2008
ACM
Software-based self-test (SBST) is emerging as a promising technology for enabling at-speed testing of high-speed embedded processors testing in an SoC system. For SBST, test rout...
MTDT
2003
IEEE
14 years 23 days ago
2003
IEEE
ct Defect-based testing for digital logic concentrates primarily on methods of test application, including for example at-speed structural tests and IDDQ testing. In contrast, defe...
ITC
2003
IEEE
14 years 23 days ago
2003
IEEE
Today’s low cost wireless phones have driven a need to be able to economically test high volumes of complex RF IC’s at a fraction of the cost of the IC. In June of 2001 the IB...