67 search results - page 8 / 14 » Embedded Deterministic Test for Low-Cost Manufacturing Test |
DDECS
2007
IEEE
14 years 1 months ago
2007
IEEE
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...
TVLSI
2008
13 years 7 months ago
2008
We present a selective encoding method that reduces test data volume and test application time for scan testing of Intellectual Property (IP) cores. This method encodes the slices ...
ICST
2008
IEEE
14 years 1 months ago
2008
IEEE
In recent years the development of automotive embedded devices has changed from an electrical and mechanical engineering discipline to a combination of software and electrical/mec...
RTCSA
2003
IEEE
14 years 24 days ago
2003
IEEE
Current hard real-time technologies are unable to support a new class of applications that have real-time constraints but with dynamic request arrivals and unpredictable resource r...
SAMOS
2005
Springer
14 years 1 months ago
2005
Springer
The design of appropriate communication architectures for complex Systems-on-Chip (SoC) is a challenging task. One promising alternative to solve these problems are Networks-on-Chi...