Built in Defect Prognosis for Embedded Memories

: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used in the industry today. The power related technology that is part of DFT MAX is presented in this paper. Built in Defect Prognosis for Embedded Memories Prashant Dubey (ST Microelectronics), Akhil Garg (ST Microelectronics), and Sravan Kumar Bhaskarani (AMD) DDECS (Design and Diagnostics of Electronic Circuits and Systems) 2007, Published: April 2007 : With the shrinking technology and increasing statistical defects, multiple design respins are required based on yield learning. Hence, a solution is required to efficiently diagnose the failure types of memory during production in the shortest time frame possible. This paper introduces a novel method of fault classification through image-based prognosis of predefined fail signature dictionary. In contrary to the existing Bitmap Diagnosis methodologies, this met...

• Type: Conference
• Year: 2007
• Where: DDECS
• Authors: Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskarani
• Keywords: DDECS 2007, DFT MAX, Hardware, Scan Compression, Verification Reuse