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ITC
1991
IEEE
80views Hardware» more  ITC 1991»
14 years 15 days ago
An Intelligent Approach to Automatic Test Equipment
In diagnosing a failed system, a smart technician would choose tests to be performed based on the context of the situation. Currently, test program sets do not fault-. isolate wit...
William R. Simpson, John W. Sheppard
DAC
2010
ACM
14 years 9 days ago
A probabilistic and energy-efficient scheduling approach for online application in real-time systems
This work considers the problem of minimizing the power consumption for real-time scheduling on processors with discrete operating modes. We provide a model for determining the ex...
Thorsten Zitterell, Christoph Scholl
AAAI
2008
13 years 11 months ago
On-line Planning and Scheduling: An Application to Controlling Modular Printers
This paper summarizes recent work reported at ICAPS on applying artificial intelligence techniques to the control of production printing equipment. Like many other real-world appl...
Minh Binh Do, Wheeler Ruml, Rong Zhou
DFT
2006
IEEE
148views VLSI» more  DFT 2006»
13 years 11 months ago
Bilateral Testing of Nano-scale Fault-tolerant Circuits
As the technology enters the nano dimension, the inherent unreliability of nanoelectronics is making fault-tolerant architectures increasingly necessary in building nano systems. ...
Lei Fang, Michael S. Hsiao
DAC
2005
ACM
13 years 11 months ago
Smart diagnostics for configurable processor verification
This paper describes a novel technique called Embedded Test-bench Control (ETC), extensively used in the verification of Tensilica’s latest configurable processor. Conventional ...
Sadik Ezer, Scott Johnson