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ICCD
2006
IEEE
113views Hardware» more  ICCD 2006»
16 years 6 days ago
A theory of Error-Rate Testing
— We have entered an era where chip yields are decreasing with scaling. A new concept called intelligible testing has been previously proposed with the goal of reversing this tre...
Shideh Shahidi, Sandeep Gupta

Lab
1058views
16 years 6 days ago
UP Electrical and Electronics Engineering Institute
The Institute's mission is to produce excellent, innovative and nationalistic engineers and to advance the field of electrical and electronics engineering. The undergr...
DASFAA
2009
IEEE
252views Database» more  DASFAA 2009»
15 years 10 months ago
Optimal Privacy-Aware Path in Hippocratic Databases
Abstract. Privacy becomes a major concern for both customers and enterprises in today’s corporate marketing strategies, many research efforts have been put into developing new p...
Min Li, Xiaoxun Sun, Hua Wang, Yanchun Zhang
AOSD
2009
ACM
15 years 10 months ago
Modelling hardware verification concerns specified in the e language: an experience report
e is an aspect-oriented hardware verification language that is widely used to verify the design of electronic circuits through the development and execution of testbenches. In rec...
Darren Galpin, Cormac Driver, Siobhán Clark...
WETICE
2009
IEEE
15 years 10 months ago
Cloud Computing and the Lessons from the Past
— The skyrocketing demand for a new generation of cloud-based consumer and business applications is driving the need for next generation of datacenters that must be massively sca...
Rao Mikkilineni, Vijay Sarathy