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DAC
2006
ACM
14 years 4 months ago
Visibility enhancement for silicon debug
Several emerging Design-for-Debug (DFD) methodologies are addressing silicon debug by making internal signal values and other data observable. Most of these methodologies require ...
Yu-Chin Hsu, Fur-Shing Tsai, Wells Jong, Ying-Tsai...
ASPDAC
2008
ACM
168views Hardware» more  ASPDAC 2008»
14 years 26 days ago
A fast two-pass HDL simulation with on-demand dump
- Simulation-based functional verification is characterized by two inherently conflicting targets: the signal visibility and simulation performance. Achieving a proper trade-off be...
Kyuho Shim, Youngrae Cho, Namdo Kim, Hyuncheol Bai...
ICIP
2006
IEEE
15 years 15 days ago
Fusion of Visible and Infrared Images using Empirical Mode Decomposition to Improve Face Recognition
In this effort, we propose a new image fusion technique, utilizing Empirical Mode Decomposition (EMD), for improved face recognition. EMD is a non-parametric datadriven analysis t...
Harishwaran Hariharan, Andreas Koschan, Besma R. A...
IJCNN
2006
IEEE
14 years 4 months ago
Off-line Signature Verification using the Enhanced Modified Direction Feature and Neural-based Classification
—Signatures continue to be an important biometric for authenticating the identity of human beings. This paper presents an effective method to perform off-line signature verificat...
Stephane Armand, Michael Blumenstein, Vallipuram M...