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ICCV
2001
IEEE
16 years 4 months ago
Error Analysis of Pure Rotation-Based Self-Calibration
Self-calibration using pure rotation is a well-known technique and has been shown to be a reliable means for recovering intrinsic camera parameters. However, in practice, it is vir...
Leslie Wang, Sing Bing Kang, Heung-Yeung Shum, Gua...
139
Voted
SIGSOFT
2003
ACM
16 years 3 months ago
ARCHER: using symbolic, path-sensitive analysis to detect memory access errors
Memory corruption errors lead to non-deterministic, elusive crashes. This paper describes ARCHER (ARray CHeckER) a static, effective memory access checker. ARCHER uses path-sensit...
Yichen Xie, Andy Chou, Dawson R. Engler
134
Voted
SIGGRAPH
1994
ACM
15 years 6 months ago
A framework for the analysis of error in global illumination algorithms
In this paper we identify sources of error in global illumination algorithms and derive bounds for each distinct category. Errors arise from three sources: inaccuracies in the bou...
James Arvo, Kenneth E. Torrance, Brian E. Smits
100
Voted
DATE
2009
IEEE
101views Hardware» more  DATE 2009»
15 years 9 months ago
Static analysis to mitigate soft errors in register files
—With continuous technology scaling, soft errors are becoming an increasingly important design concern even for earth-bound applications. While compiler approaches have the poten...
Jongeun Lee, Aviral Shrivastava
118
Voted
ICCAD
2000
IEEE
97views Hardware» more  ICCAD 2000»
15 years 7 months ago
Error Catch and Analysis for Semiconductor Memories Using March Tests
We present an error catch and analysis (ECA) system for semiconductor memories. The system consists of a test algorithm generator called TAGS, a fault simulator called RAMSES, and...
Chi-Feng Wu, Chih-Tsun Huang, Chih-Wea Wang, Kuo-L...