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107
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ICPR
2002
IEEE
15 years 7 months ago
Analysis of Error-Reject Trade-off in Linearly Combined Classifiers
In this paper, a framework for the analysis of the error-reject trade-off in linearly combined classifiers is proposed. We start from a framework developed by Tumer and Ghosh [1,2...
Fabio Roli, Giorgio Fumera, Gianni Vernazza
149
Voted
DATE
2005
IEEE
128views Hardware» more  DATE 2005»
15 years 8 months ago
Soft-Error Tolerance Analysis and Optimization of Nanometer Circuits
Nanometer circuits are becoming increasingly susceptible to soft-errors due to alpha-particle and atmospheric neutron strikes as device scaling reduces node capacitances and suppl...
Yuvraj Singh Dhillon, Abdulkadir Utku Diril, Abhij...
113
Voted
ICIP
2000
IEEE
16 years 4 months ago
Quantitative Error Analysis of Color in IEEE Publications
To demonstrate the performance of color image processing algorithms, it is desirable to be able to accurately display color images in archival publications. Our previous work [1],...
Michael J. Vrhel, H. Joel Trussell
105
Voted
IOLTS
2007
IEEE
88views Hardware» more  IOLTS 2007»
15 years 9 months ago
Automated Derivation of Application-aware Error Detectors using Static Analysis
Karthik Pattabiraman, Zbigniew Kalbarczyk, Ravisha...