In this paper, a framework for the analysis of the error-reject trade-off in linearly combined classifiers is proposed. We start from a framework developed by Tumer and Ghosh [1,2...
Nanometer circuits are becoming increasingly susceptible to soft-errors due to alpha-particle and atmospheric neutron strikes as device scaling reduces node capacitances and suppl...
To demonstrate the performance of color image processing algorithms, it is desirable to be able to accurately display color images in archival publications. Our previous work [1],...