In this paper, a Triangularization Based Structure preserving (TBS) model order reduction is proposed to verify power integrity of on-chip structured power grid. The power grid is...
Bias temperature instability, hot-carrier injection, and gate-oxide wearout will cause severe lifetime degradation in the performance and the reliability of future CMOS devices. Th...
Erika Gunadi, Abhishek A. Sinkar, Nam Sung Kim, Mi...
Aimsof traditional planners had beenlimited to finding a sequenceof operators rather than finding an optimal or neax-optimalfinal state. Consequent]y, the performanceimprovementsy...
The verification of large radio-frequency/millimeter-wave (RF/MM) integrated circuits (ICs) has regained attention for high-performance designs beyond 90nm and 60GHz. The traditio...
With the ever-increasing transistor variability in CMOS technology, it is essential to integrate variation-aware performance analysis into the task allocation and scheduling proce...