532 search results - page 25 / 107 » Estimation of Time-Varying Parameters in Statistical Models:... |
JMLR
2006
13 years 7 months ago
2006
The task of learning models for many real-world problems requires incorporating domain knowledge into learning algorithms, to enable accurate learning from a realistic volume of t...
DATE
2010
IEEE
14 years 23 days ago
2010
IEEE
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
ICCV
2007
IEEE
14 years 9 months ago
2007
IEEE
We address the problem of registering a sequence of images in a moving dynamic texture video. This involves optimization with respect to camera motion, the average image, and the ...
WSC
1998
13 years 9 months ago
1998
This paper reviews statistical methods for analyzing output data from computer simulations of single systems. In particular, it focuses on the problems of choosing initial conditi...
ICCD
2007
IEEE
14 years 2 months ago
2007
IEEE
A methodology for constructing circuit-level mismatch models and performing yield optimization is presented for CMOS analog circuits. The methodology combines statistical techniqu...