Abstract--Technology scaling in the nanometer era has increased the transistor's susceptibility to process variations. The effects of such variations are having a huge impact ...
Venkataraman Mahalingam, N. Ranganathan, J. E. Har...
—This paper presents a novel cross-layer design for joint power and end-to-end rate control optimization in DSCDMA wireless networks, along with a detailed implementation and eva...
Marco Belleschi, Lapo Balucanti, Pablo Soldati, Mi...
We combine interactive evolutionary computation (IEC) with existing evolutionary synthesis software for the design of micromachined resonators and evaluate its effectiveness using...
Raffi R. Kamalian, Hideyuki Takagi, Alice M. Agogi...
We apply a scalable approach for practical, comprehensive design space evaluation and optimization. This approach combines design space sampling and statistical inference to ident...
Software-Based Self-Test (SBST) has emerged as an effective strategy for on-line testing of processors integrated in non-safety critical embedded system applications. Among the mo...
Andreas Merentitis, Nektarios Kranitis, Antonis M....