469 search results - page 4 / 94 » Evolutionary Approach to Test Generation for Functional BIST |
VTS
1997
IEEE
13 years 12 months ago
1997
IEEE
Despite all of the advantages that circular BIST ofsers compared to conventional BIST approaches in terms of low area overhead, simple control logic, and easy insertion, it has se...
DAC
1997
ACM
13 years 11 months ago
1997
ACM
This paper presents a new scan-based BIST scheme which achieves very high fault coverage without the deficiencies of previously proposed schemes. This approach utilizes scan order...
TVLSI
2002
13 years 7 months ago
2002
Circular built-in self-test (BIST) is a "test per clock" scheme that offers many advantages compared with conventional BIST approaches in terms of low area overhead, simp...
ICCAD
1994
IEEE
13 years 11 months ago
1994
IEEE
Existing built-in self test (BIST) strategies require the use of specialized test pattern generation hardware which introduces signi cant area overhead and performance degradation...
ICCAD
1996
IEEE
13 years 11 months ago
1996
IEEE
A scan-based BIST scheme is presented which guarantees complete fault coverage with very low hardware overhead. A probabilistic analysis shows that the output of an LFSR which fee...