469 search results - page 52 / 94 » Evolutionary Approach to Test Generation for Functional BIST |
DAC
2001
ACM
14 years 10 months ago
2001
ACM
We propose a new BDD-based method for decomposition of multi-output incompletely specified logic functions into netlists of two-input logic gates. The algorithm uses the internal ...
ICCD
2006
IEEE
14 years 5 months ago
2006
IEEE
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
GECCO
2007
Springer
14 years 3 months ago
2007
Springer
A significant problem for evolving artificial neural networks is that the physical arrangement of sensors and effectors is invisible to the evolutionary algorithm. For example,...
CORR
2010
Springer
13 years 9 months ago
2010
Springer
Defect prevention is the most vital but habitually neglected facet of software quality assurance in any project. If functional at all stages of software development, it can condens...
CEC
2007
IEEE
13 years 10 months ago
2007
IEEE
— Cultured natural cortical neurons form functional networks through a complex set of developmental steps during the first weeks in vitro. The dynamic behavior of the network in...