469 search results - page 5 / 94 » Evolutionary Approach to Test Generation for Functional BIST |
ITC
1996
IEEE
13 years 11 months ago
1996
IEEE
This paper presents a low-overhead scheme for built-in self-test of circuits with scan. Complete (100%) fault coverage is obtained without modifying the function logic and without...
ICCAD
1995
IEEE
13 years 11 months ago
1995
IEEE
Recently a deterministic built-in self-test scheme has been presented based on reseeding of multiple-polynomial linear feedback shift registers. This scheme encodes deterministic ...
ISCAS
1999
IEEE
13 years 12 months ago
1999
IEEE
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...
MTV
2005
IEEE
14 years 1 months ago
2005
IEEE
Microprocessor technology is increasingly used for many applications; the large market volumes call for cost containment in the production phase. Process yield for processor produ...
ATS
1998
IEEE
13 years 12 months ago
1998
IEEE
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...