469 search results - page 9 / 94 » Evolutionary Approach to Test Generation for Functional BIST |
KBSE
2007
IEEE
14 years 1 months ago
2007
IEEE
Automating the generation of object-oriented unit tests is a challenging task. This is mainly due to the complexity and peculiarities that the principles of object-orientation imp...
EUROGP
2003
Springer
14 years 26 days ago
2003
Springer
Test programs are fragment of code, but, unlike ordinary application programs, they are not intended to solve a problem, nor to calculate a function. Instead, they are supposed to ...
ECAL
2001
Springer
14 years 4 days ago
2001
Springer
Bedau and Packard’s evolutionary activity statistics [1, 2] are used to classify the evolutionary dynamics in Geb [3, 4], a system designed to verify and extend theories behind t...
DFT
2003
IEEE
14 years 29 days ago
2003
IEEE
1 This paper presents a solution to the test time minimization problem for core-based systems that contain sequential cores with STUMPS architecture. We assume a hybrid BIST approa...
VTS
1995
IEEE
13 years 11 months ago
1995
IEEE
This paper presents a new approach for on-chip test pattern generation. The set of test patterns generated by a pseudo-random pattern generator (e.g., an LFSR) is transformed into...