122 search results - page 8 / 25 » Evolvable Hardware for the Generation of Sequential Filter C... |
NIPS
2001
13 years 8 months ago
2001
We present a sequential Monte Carlo method applied to additive noise compensation for robust speech recognition in time-varying noise. The method generates a set of samples accord...
ISCAS
2007
IEEE
14 years 1 months ago
2007
IEEE
Due to the development of high speed circuits beyond the 2-GHz mark, the significance of automatic test pattern generation for Path Delay Faults (PDFs) drastically increased in t...
DATE
1999
IEEE
13 years 11 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
ATS
2000
IEEE
13 years 11 months ago
2000
IEEE
We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vecto...
ICCD
1997
IEEE
13 years 11 months ago
1997
IEEE
This paper presents a new approach to the automated generation of an initialization sequence for synchronous sequential circuits. Finding an initialization sequence is a hard task...