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IOLTS
2007
IEEE
120views Hardware» more  IOLTS 2007»
14 years 2 months ago
Accelerating Soft Error Rate Testing Through Pattern Selection
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu
LADC
2007
Springer
14 years 1 months ago
Security Patterns and Secure Systems Design
Analysis and design patterns are well established as a convenient and reusable way to build high-quality object-oriented software. Patterns combine experience and good practices t...
Eduardo B. Fernández
CCGRID
2006
IEEE
14 years 1 months ago
Component-Based Modeling, Analysis and Animation
Component-based software construction is widely used in a variety of applications, from embedded environments to grid computing. However, errors in these applications and systems ...
Jeff Kramer
CODES
2006
IEEE
14 years 1 months ago
Generic netlist representation for system and PE level design exploration
Designer productivity and design predictability are vital factors for successful embedded system design. Shrinking time-to-market and increasing complexity of these systems requir...
Bita Gorjiara, Mehrdad Reshadi, Pramod Chandraiah,...
CODES
2006
IEEE
14 years 1 months ago
System-level power-performance trade-offs in bus matrix communication architecture synthesis
System-on-chip communication architectures have a significant impact on the performance and power consumption of modern multiprocessor system-on-chips (MPSoCs). However, customiza...
Sudeep Pasricha, Young-Hwan Park, Fadi J. Kurdahi,...