Traditional timing-driven placement considers only combinational delays and does not take into account the potential of subsequent sequential optimization steps. As a result, the ...
Solid-state image sensors develop in-field defects in all common environments. Experiments have demonstrated the growth of significant quantities of hot-pixel defects that degrade...
Jozsef Dudas, Michelle L. La Haye, Jenny Leung, Gl...
Memory systems consume a significant portion of power in handheld embedded systems. So far, low-power memory techniques have addressed the power consumption when the system is tu...
Field-programmable gate arrays are well-suited to DSP and digital communications applications. SRAM-based FPGAs, however, are susceptible to radiation-induced single-event upsets ...
Brian H. Pratt, Michael J. Wirthlin, Michael P. Ca...
Testing of embedded cores is very difficult in SOC (system-on-a-chip), since the core user may not know the gate level implementation of the core, and the controllability and obse...