Post-silicon validation is used to detect and fix bugs in integrated circuits and systems after manufacture. Due to sheer design complexity, it is nearly impossible to detect and ...
Subhasish Mitra, Sanjit A. Seshia, Nicola Nicolici
Due to the inherent nature of heat flow in 3D integrated circuits, stacked dies exhibit a wide range of thermal characteristics. The strong dependence of leakage with temperature...
Abstract—Rapid advances in integrated circuit (IC) development predicted by Moore’s Law lead to increasingly complex, hard to verify IC designs. Design insiders or adversaries ...
Measurement studies indicate a high rate of node dynamics in p2p systems. In this paper, we address the question of how high a rate of node dynamics can be supported by structured...
Advanced CAD tools and high-density VLSI technologies have combined to create a new market for reusable digital designs. The economic viability of the new core-based design paradig...
John Lach, William H. Mangione-Smith, Miodrag Potk...