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ASPLOS
2006
ACM
13 years 11 months ago
SlicK: slice-based locality exploitation for efficient redundant multithreading
Transient faults are expected a be a major design consideration in future microprocessors. Recent proposals for transient fault detection in processor cores have revolved around t...
Angshuman Parashar, Anand Sivasubramaniam, Sudhanv...
DSN
2006
IEEE
14 years 1 months ago
Automatic Instruction-Level Software-Only Recovery
As chip densities and clock rates increase, processors are becoming more susceptible to transient faults that can affect program correctness. Computer architects have typically ad...
Jonathan Chang, George A. Reis, David I. August
IEEEPACT
2008
IEEE
14 years 1 months ago
Skewed redundancy
Technology scaling in integrated circuits has consistently provided dramatic performance improvements in modern microprocessors. However, increasing device counts and decreasing o...
Gordon B. Bell, Mikko H. Lipasti
APCSAC
2005
IEEE
14 years 1 months ago
Resource-Driven Optimizations for Transient-Fault Detecting SuperScalar Microarchitectures
Increasing microprocessor vulnerability to soft errors induced by neutron and alpha particle strikes prevents aggressive scaling and integration of transistors in future technologi...
Jie Hu, Greg M. Link, Johnsy K. John, Shuai Wang, ...
ASPLOS
2012
ACM
12 years 3 months ago
Relyzer: exploiting application-level fault equivalence to analyze application resiliency to transient faults
Future microprocessors need low-cost solutions for reliable operation in the presence of failure-prone devices. A promising approach is to detect hardware faults by deploying low-...
Siva Kumar Sastry Hari, Sarita V. Adve, Helia Naei...