55 search results - page 4 / 11 » Extraction Error Diagnosis and Correction in High-Performanc... |
DATE
2010
IEEE
14 years 5 hour ago
2010
IEEE
: Scaling down in very deep submicron (VDSM) technologies increases the delay, power consumption of on-chip interconnects, while the reliability and yield decrease. In high perform...
VTS
2007
IEEE
14 years 1 months ago
2007
IEEE
In this paper, we identify two main bottlenecks in the functional diagnosis flow and propose new ways to overcome these. Our approach completely eliminates the “Primary Input (P...
DKE
2010
13 years 7 months ago
2010
Workflow analysis is indispensable to capture modeling errors in workflow designs. While several workflow analysis approaches have been defined previously, these approaches do not...
ICCD
2004
IEEE
14 years 3 months ago
2004
IEEE
In modern technologies, process variations can be quite substantial, often causing design timing failures. It is essential that those errors be correctly and quickly diagnosed. In...
DAC
2009
ACM
14 years 8 months ago
2009
ACM
Recent improvements in design verification strive to automate error detection and greatly enhance engineers' ability to detect functional errors. However, the process of diag...