55 search results - page 6 / 11 » Extraction Error Diagnosis and Correction in High-Performanc... |
ISQED
2009
IEEE
14 years 2 months ago
2009
IEEE
Abstract — Nanoelectronic design faces unprecedented reliability challenges and must achieve noise immunity and delay insensitiveness in the presence of prevalent defects and sig...
CVPR
2007
IEEE
14 years 9 months ago
2007
IEEE
Creating uniform lighting for archival-quality document acquisition remains a non-trivial problem. We propose a novel method for automatic photometric correction of nonplanar docu...
CASES
2006
ACM
14 years 1 months ago
2006
ACM
With advances in process technology, soft errors (SE) are becoming an increasingly critical design concern. Due to their large area and high density, caches are worst hit by soft ...
ASPDAC
2010
ACM
13 years 5 months ago
2010
ACM
Escaped errors in released silicon are growing in number due to the increasing complexity of modern processor designs and shrinking production schedules. Worsening the problem are ...
ICCAD
2007
IEEE
14 years 4 months ago
2007
IEEE
— Computing counterexamples is a crucial task for error diagnosis and debugging of sequential systems. If an implementation does not fulfill its specification, counterexamples ...