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DATE
2003
IEEE
131views Hardware» more  DATE 2003»
14 years 2 months ago
High Speed and Highly Testable Parallel Two-Rail Code Checker
In this article we propose a high speed and highly testable parallel two-rail code checker, which features a compact structure and is Totally-Self-Checking or Strongly Code-Disjoi...
Martin Omaña, Daniele Rossi, Cecilia Metra
CW
2004
IEEE
14 years 24 days ago
Barcode Readers using the Camera Device in Mobile Phones
This paper shows new algorithms and the implementations of image reorganization for EAN/QR barcodes in mobile phones. The mobile phone system used here consists of a camera, mobil...
Eisaku Ohbuchi, Hiroshi Hanaizumi, Lim Ah Hock
WSC
2001
13 years 10 months ago
Simulating networks of wireless sensors
Recent advances in low-power embedded processors, radios, and micro-mechanical systems (MEMs) have made possible the development of networks of wirelessly interconnected sensors. ...
Sung Park, Andreas Savvides, Mani B. Srivastava
ICCAD
2009
IEEE
121views Hardware» more  ICCAD 2009»
13 years 6 months ago
MOLES: Malicious off-chip leakage enabled by side-channels
Economic incentives have driven the semiconductor industry to separate design from fabrication in recent years. This trend leads to potential vulnerabilities from untrusted circui...
Lang Lin, Wayne Burleson, Christof Paar
WOSS
2004
ACM
14 years 2 months ago
Combining statistical monitoring and predictable recovery for self-management
Complex distributed Internet services form the basis not only of e-commerce but increasingly of mission-critical networkbased applications. What is new is that the workload and in...
Armando Fox, Emre Kiciman, David A. Patterson