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DDECS
2007
IEEE
105views Hardware» more  DDECS 2007»
14 years 2 months ago
Layout to Logic Defect Analysis for Hierarchical Test Generation
- As shown by previous studies, shorts between the interconnect wires should be considered as the predominant cause of failures in CMOS circuits. Fault models and tools for targeti...
Maksim Jenihhin, Jaan Raik, Raimund Ubar, Witold A...
SSS
2010
Springer
139views Control Systems» more  SSS 2010»
13 years 6 months ago
Vulnerability Analysis of High Dimensional Complex Systems
Complex systems experience dramatic changes in behavior and can undergo transitions from functional to dysfunctional states. An unstable system is prone to dysfunctional collective...
Vedant Misra, Dion Harmon, Yaneer Bar-Yam
MASCOTS
2007
13 years 9 months ago
Multiobjective Analysis in Wireless Mesh Networks
Abstract— Wireless Mesh Networks are a scalable and costeffective solution for next-generation wireless networking. In the present work, we consider the Round Weighting Problem (...
Cristiana Gomes, Gurvan Huiban
HICSS
2003
IEEE
124views Biometrics» more  HICSS 2003»
14 years 28 days ago
Identifying Transformer Incipient Events for Maintaining Distribution System Reliability
This paper presents the time domain and timefrequency domain analysis results of incipient events in single-phase distribution transformers. This analysis will aid in the developm...
Karen L. Butler-Purry, Mustafa Bagriyanik
ASPDAC
2004
ACM
94views Hardware» more  ASPDAC 2004»
13 years 11 months ago
Improving simulation-based verification by means of formal methods
The design of complex systems is largely ruled by the time needed for verification. Even though formal methods can provide higher reliability, in practice often simulation based ve...
Görschwin Fey, Rolf Drechsler