Data correlation is a well-known problem that causes difficulty in VLSI testing. Based on a correlation metric, an efficient heuristic to select BIST registers has been proposed...
Zhihong Zeng, Qiushuang Zhang, Ian G. Harris, Maci...
In this paper, we propose a method for discovering hidden information from large-scale item set data based on the symmetry of items. Symmetry is a fundamental concept in the theory...
We consider the problem of computing all-pair correlations in a warehouse containing a large number (e.g., tens of thousands) of time-series (or, signals). The problem arises in a...
1 In this paper, we propose a hybrid approach for estimating the switching activities of the internal nodes in logic circuits. The new approach combines the advantages of the simul...
David Ihsin Cheng, Kwang-Ting Cheng, Deborah C. Wa...