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DDECS
2009
IEEE
128views Hardware» more  DDECS 2009»
14 years 2 months ago
A fast untestability proof for SAT-based ATPG
—Automatic Test Pattern Generation (ATPG) based on Boolean satisfiability (SAT) has been shown to be a beneficial complement to traditional ATPG techniques. Boolean solvers wor...
Daniel Tille, Rolf Drechsler
IPPS
2003
IEEE
14 years 1 months ago
Accurate Method for Fast Design of Diagnostic Oligonucleotide Probe Sets for DNA Microarrays
We present a method for the automatic generation of oligonucleotide probe sets for DNA microarrays. This approach is well suited particularly for specificity evaluation of design...
Andreas Krause, Markus Kräutner, Harald Meier
ICANN
2003
Springer
14 years 1 months ago
Meta-learning for Fast Incremental Learning
Model based learning systems usually face to a problem of forgetting as a result of the incremental learning of new instances. Normally, the systems have to re-learn past instances...
Takayuki Oohira, Koichiro Yamauchi, Takashi Omori
ASPDAC
2007
ACM
156views Hardware» more  ASPDAC 2007»
14 years 4 days ago
PLLSim - An Ultra Fast Bang-Bang Phase Locked Loop Simulation Tool
- This paper presents a simulation tool targeted specifically at bang-bang type phase locked loop systems. The aim of this simulator is to quickly and accurately predict important ...
Michael Chan, Adam Postula, Yong Ding
NIPS
1993
13 years 9 months ago
Fast Pruning Using Principal Components
We present a new algorithm for eliminating excess parameters and improving network generalization after supervised training. The method, \Principal Components Pruning (PCP)",...
Asriel U. Levin, Todd K. Leen, John E. Moody