730 search results - page 100 / 146 » Faster dimension reduction |
DATE
2007
IEEE
14 years 3 months ago
2007
IEEE
Due to reduction in device feature size and supply voltage, the sensitivity to radiation induced transient faults (soft errors) of digital systems increases dramatically. Intensiv...
ICDAR
2007
IEEE
14 years 3 months ago
2007
IEEE
Decoding noisy document images is commonly needed in applications such as enterprise content management. Available OCR solutions are still not satisfactory especially on noisy ima...
ISVLSI
2007
IEEE
14 years 3 months ago
2007
IEEE
In this work, we present a genetic algorithm based automated circuit synthesis framework for passive analog circuits. A procedure is developed for the simultaneous generation of b...
SECON
2007
IEEE
14 years 3 months ago
2007
IEEE
Base station location has significant impact on network lifetime performance for a sensor network. For a multihop sensor network, this problem is particular challenging as we need ...
DATE
2006
IEEE
14 years 2 months ago
2006
IEEE
— In this paper, we present an analysis methodology to compute circuit node sensitivity due to charged particle induced delay (timing) errors, Soft Delay Errors (SDE). We define...