195 search results - page 36 / 39 » Fault Analysis of DPA-Resistant Algorithms |
SIGSOFT
2006
ACM
14 years 8 months ago
2006
ACM
Testing and code editing are interleaved activities during program development. When tests fail unexpectedly, the changes that caused the failure(s) are not always easy to find. W...
CODES
2009
IEEE
14 years 2 months ago
2009
IEEE
This paper presents a system-level design methodology for networked embedded systems that exploits existing data-redundancy to increase their reliability. The presented approach n...
SECON
2007
IEEE
14 years 1 months ago
2007
IEEE
—We consider surveillance applications in which sensors are deployed in large numbers to improve coverage fidelity. Previous research has studied how to select active sensor cov...
VTS
2006
IEEE
14 years 1 months ago
2006
IEEE
— In this paper, an algorithm for scan vector ordering, PEAKASO, is proposed to minimize the peak temperature during scan testing. Given a circuit with scan and the scan vectors,...
DATE
2003
IEEE
14 years 23 days ago
2003
IEEE
We propose a technique for compressing test vectors. The technique reduces test application time and tester memory requirements by utilizing part of the predecessor response in co...