We present a general scheme for virtualizing main memory errorcorrection mechanisms, which map redundant information needed to correct errors into the memory namespace itself. We ...
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...