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» Fault Detection Effectiveness of Spathic Test Data
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ITC
1998
IEEE
174views Hardware» more  ITC 1998»
14 years 1 months ago
High volume microprocessor test escapes, an analysis of defects our tests are missing
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
Wayne M. Needham, Cheryl Prunty, Yeoh Eng Hong
DATE
2009
IEEE
148views Hardware» more  DATE 2009»
14 years 3 months ago
A new design-for-test technique for SRAM core-cell stability faults
—Core-cell stability represents the ability of the core-cell to keep the stored data. With the rapid development of semiconductor memories, their test is becoming a major concern...
Alexandre Ney, Luigi Dilillo, Patrick Girard, Serg...
APSEC
2008
IEEE
14 years 3 months ago
Test Case Prioritization Based on Analysis of Program Structure
Test case prioritization techniques have been empirically proved to be effective in improving the rate of fault detection in regression testing. However, most of previous techniqu...
Zengkai Ma, Jianjun Zhao
ATS
2000
IEEE
145views Hardware» more  ATS 2000»
14 years 1 months ago
Compaction-based test generation using state and fault information
We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vecto...
Ashish Giani, Shuo Sheng, Michael S. Hsiao, Vishwa...
ICSM
2007
IEEE
14 years 3 months ago
Combinatorial Interaction Regression Testing: A Study of Test Case Generation and Prioritization
Regression testing is an expensive part of the software maintenance process. Effective regression testing techniques select and order (or prioritize) test cases between successive...
Xiao Qu, Myra B. Cohen, Katherine M. Woolf