414 search results - page 18 / 83 » Fault Detection Effectiveness of Spathic Test Data |
DFT
1997
IEEE
14 years 1 months ago
1997
IEEE
Abstract— Error control is a major concern in many computer systems, particularly those deployed in critical applications. Experience shows that most malfunctions during system o...
DASFAA
2008
IEEE
13 years 10 months ago
2008
IEEE
A pattern is considered useful if it can be used to help a person to achieve his goal. Mining data streams for useful patterns is important in many applications. However, data stre...
ETS
2006
IEEE
14 years 2 months ago
2006
IEEE
The application of Dynamic Voltage Scaling (DVS) to reduce energy consumption may have a detrimental impact on the quality of manufacturing tests employed to detect permanent faul...
DATE
2007
IEEE
14 years 3 months ago
2007
IEEE
∗ This paper presents an analysis of the electrical origins of Slow Write Driver Faults (SWDFs) [1] that may affect SRAM write drivers in 65nm technology. This type of fault is t...
DATE
2007
IEEE
14 years 3 months ago
2007
IEEE
Error-tolerance is an innovative way to enhance the effective yield of IC products. Previously a test methodology based on error-rate estimation to support error-tolerance was pro...