414 search results - page 56 / 83 » Fault Detection Effectiveness of Spathic Test Data |
ANSS
2000
IEEE
14 years 2 days ago
2000
IEEE
Software systems are known to suffer from outages due to transient errors. Recently, the phenomenon of “software aging”, one in which the state of the software system degrades...
DATE
2010
IEEE
14 years 23 days ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
ICSE
2008
IEEE-ACM
14 years 7 months ago
2008
IEEE-ACM
Several tools and methods for source code quality assurance based on static analysis finally reached a state when they are applicable in practice and recognized by the industry. H...
ICCAD
2005
IEEE
14 years 4 months ago
2005
IEEE
The presence of unknown values in the simulation result is a key barrier to effective output response compaction in practice. This paper proposes a simple circuit module, called a...
BMCBI
2008
13 years 7 months ago
2008
Background: Microarray experiments measure changes in the expression of thousands of genes. The resulting lists of genes with changes in expression are then searched for biologica...