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ITC
2003
IEEE
134views Hardware» more  ITC 2003»
14 years 2 months ago
Effectiveness Improvement of ECR Tests
Energy Consumption Ratio (ECR) test, a current-based test, has shown its ability to reduce the impact of process variations and detect hard-to-detect faults. The effectiveness of ...
Wanli Jiang, Erik Peterson, Bob Robotka
ASPDAC
2005
ACM
96views Hardware» more  ASPDAC 2005»
13 years 10 months ago
Oscillation ring based interconnect test scheme for SOC
- We propose a novel oscillation ring (OR) test architecture for testing interconnects in SoC. In addition to stuck-at and open faults, this scheme can detect delay faults and cr...
Katherine Shu-Min Li, Chung-Len Lee, Chauchin Su, ...
ESEM
2008
ACM
13 years 10 months ago
Web application fault classification - an exploratory study
Controlled experiments in web application testing use seeded faults to evaluate the effectiveness of the testing technique. However, the classes of seeded faults are not always ex...
Yuepu Guo, Sreedevi Sampath
GLVLSI
2002
IEEE
136views VLSI» more  GLVLSI 2002»
14 years 1 months ago
Test generation for resistive opens in CMOS
This paper develops new techniques for detecting both stuck-open faults and resistive open faults, which result in increased delays along some paths. The improved detection of CMO...
Arun Krishnamachary, Jacob A. Abraham
TNN
2008
132views more  TNN 2008»
13 years 8 months ago
Just-in-Time Adaptive Classifiers - Part I: Detecting Nonstationary Changes
Abstract--The stationarity requirement for the process generating the data is a common assumption in classifiers' design. When such hypothesis does not hold, e.g., in applicat...
Cesare Alippi, Manuel Roveri