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DDECS
2007
IEEE
201views Hardware» more  DDECS 2007»
14 years 1 months ago
Built in Defect Prognosis for Embedded Memories
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...
Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskaran...
ASAP
2005
IEEE
165views Hardware» more  ASAP 2005»
14 years 1 months ago
CONAN - A Design Exploration Framework for Reliable Nano-Electronics
In this paper we introduce a design methodology that allows the system/circuit designer to build reliable systems out of unreliable nano-scale components. The central point of our...
Sorin Cotofana, Alexandre Schmid, Yusuf Leblebici,...
ISCA
2009
IEEE
199views Hardware» more  ISCA 2009»
14 years 2 months ago
SigRace: signature-based data race detection
Detecting data races in parallel programs is important for both software development and production-run diagnosis. Recently, there have been several proposals for hardware-assiste...
Abdullah Muzahid, Darío Suárez Graci...
FOSSACS
2005
Springer
14 years 1 months ago
Branching Cells as Local States for Event Structures and Nets: Probabilistic Applications
We study the concept of choice for true concurrency models such as prime event structures and safe Petri nets. We propose a dynamic variation of the notion of cluster previously in...
Samy Abbes, Albert Benveniste
FGCS
2008
102views more  FGCS 2008»
13 years 7 months ago
Making the best of a bad situation: Prioritized storage management in GEMS
As distributed storage systems grow, the response time between detection and repair of the error becomes significant. Systems built on shared servers have additional complexity be...
Justin M. Wozniak, Paul Brenner, Douglas Thain, Aa...