Negative bias temperature instability (NBTI) has become a dominant reliability concern for nanoscale PMOS transistors. In this paper, we propose variable-latency adder (VL-adder) ...
The design and implementation of distributed real-time dependable systems is often dominated by non-functional considerations like timeliness, object placement and fault tolerance...
Abstract--This paper proposes a method for deriving formal specifications of systems. To accomplish this task we pass through a non trivial number of steps, concepts and tools wher...
— With the continuing downscaling of microelectronic technology, chip reliability becomes a great threat to the design of future complex microelectronic systems. Hence increasing...
To assure dependable onboard evolution, we have developed a methodology called guarded software upgrading (GSU). In this paper, we focus on a low-cost approach to error containmen...
Ann T. Tai, Kam S. Tso, Leon Alkalai, Savio N. Cha...