This paper presents an experimental evaluation of the fault-tolerant communication (FTCOM) layer of the DECOS integrated architecture. The FTCOM layer implements different agreemen...
Jonny Vinter, Henrik Eriksson, Astrit Ademaj, Bern...
Future process nodes have such small feature sizes that there will be an increase in the number of manufacturing defects per die. For large FPGAs, it will be critical to tolerate ...
It is widely accepted that transient failures will appear more frequently in chips designed in the near future due to several factors such as the increased integration scale. On t...
It is widely accepted that transient failures will appear more frequently in chips designed in the near future due to several factors such as the increased integration scale. On th...
With rapid increase of parallel computation systems in their sizes, it is inevitable to develop algorithms that are applicable even if there exist faulty elements in the systems. ...