The partial reconfiguration feature of some of the currentgeneration Field Programmable Gate Arrays (FPGAs) can improve dependability by detecting and correcting errors in onchip ...
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
We propose a sensornet programming model based on declarative spatio-temporal constraints on events only, not sensors. Where previous approaches conflate events and sensors becaus...