1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
Aggressive scaling of technology has an adverse impact on the reliability of VLSI circuits. Apart from increasing transient error susceptibility, the circuits also become more vul...
Correctness is a paramount attribute of any microprocessor design; however, without novel technologies to tame the increasing complexity of design verification, the amount of bugs...
Declarative Networking has been recently promoted as a high-level programming paradigm to more conveniently describe and implement systems that run in a distributed fashion over a ...
We propose a new paradigm for building scalable distributed systems. Our approach does not require dealing with message-passing protocols—a major complication in existing distri...
Marcos Kawazoe Aguilera, Arif Merchant, Mehul A. S...