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DAC
2008
ACM
14 years 8 months ago
Study of the effects of MBUs on the reliability of a 150 nm SRAM device
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
Juan Antonio Maestro, Pedro Reviriego
DAC
2006
ACM
14 years 8 months ago
FLAW: FPGA lifetime awareness
Aggressive scaling of technology has an adverse impact on the reliability of VLSI circuits. Apart from increasing transient error susceptibility, the circuits also become more vul...
Suresh Srinivasan, Prasanth Mangalagiri, Yuan Xie,...
DAC
2006
ACM
14 years 8 months ago
Shielding against design flaws with field repairable control logic
Correctness is a paramount attribute of any microprocessor design; however, without novel technologies to tame the increasing complexity of design verification, the amount of bugs...
Ilya Wagner, Valeria Bertacco, Todd M. Austin
PADL
2009
Springer
14 years 8 months ago
Operational Semantics for Declarative Networking
Declarative Networking has been recently promoted as a high-level programming paradigm to more conveniently describe and implement systems that run in a distributed fashion over a ...
Juan A. Navarro, Andrey Rybalchenko
SOSP
2007
ACM
14 years 4 months ago
Sinfonia: a new paradigm for building scalable distributed systems
We propose a new paradigm for building scalable distributed systems. Our approach does not require dealing with message-passing protocols—a major complication in existing distri...
Marcos Kawazoe Aguilera, Arif Merchant, Mehul A. S...