In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
Nanowire crossbar circuits are an emerging architectural paradigm that promises a higher integration density and an improved fault-tolerance due to its reconfigurability. In this...
M. Haykel Ben Jamaa, Gianfranco Cerofolini, Yusuf ...
The demand for more computational power in science and engineering has spurred the design and deployment of ever-growing cluster systems. Even though the individual components use...
Device scaling trends dramatically increase the susceptibility of microprocessors to soft errors. Further, mounting demand for embedded microprocessors in a wide array of safety c...
Jason A. Blome, Shantanu Gupta, Shuguang Feng, Sco...
In recent years peer-to-peer (P2P) technology has been adopted by Internet-based malware as a fault tolerant and scalable communication medium for self-organization and survival. I...