Fault dictionary compaction has been accomplished in the past by removing responses on individual output pins for specic test vectors. In contrast to the previous work, we presen...
: We present a new, dynamic algorithm for test sequence compaction and test cycle reduction for combinationaland sequential circuits. Several dynamic algorithms for compaction in c...
Two fast algorithms for static test sequence compaction are proposed for sequential circuits. The algorithms are based on the observation that test sequences traverse through a sm...
Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. P...
A new approach for protection of transmission line including TCSC is presented in this paper. The proposed method includes application of Fuzzy Neural Network for distance relaying...
S. R. Samantaray, Pradipta K. Dash, Ganapati Panda...