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» Fault emulation: a new approach to fault grading
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ICDM
2006
IEEE
76views Data Mining» more  ICDM 2006»
14 years 2 months ago
How Bayesians Debug
Manual debugging is expensive. And the high cost has motivated extensive research on automated fault localization in both software engineering and data mining communities. Fault l...
Chao Liu 0001, Zeng Lian, Jiawei Han
ICST
2009
IEEE
14 years 2 months ago
A Test-Driven Approach to Developing Pointcut Descriptors in AspectJ
Aspect-oriented programming (AOP) languages introduce new constructs that can lead to new types of faults, which must be targeted by testing techniques. In particular, AOP languag...
Romain Delamare, Benoit Baudry, Sudipto Ghosh, Yve...
ISCAS
2007
IEEE
128views Hardware» more  ISCAS 2007»
14 years 2 months ago
SAT-based ATPG for Path Delay Faults in Sequential Circuits
Due to the development of high speed circuits beyond the 2-GHz mark, the significance of automatic test pattern generation for Path Delay Faults (PDFs) drastically increased in t...
Stephan Eggersglüß, Görschwin Fey,...
ICSE
2009
IEEE-ACM
14 years 2 months ago
Lightweight fault-localization using multiple coverage types
Lightweight fault-localization techniques use program coverage to isolate the parts of the code that are most suspicious of being faulty. In this paper, we present the results of ...
Raúl A. Santelices, James A. Jones, Yanbing...
ICAC
2005
IEEE
14 years 1 months ago
Multi-resolution Abnormal Trace Detection Using Varied-length N-grams and Automata
Detection and diagnosis of faults in a large-scale distributed system is a formidable task. Interest in monitoring and using traces of user requests for fault detection has been o...
Guofei Jiang, Haifeng Chen, Cristian Ungureanu, Ke...