327 search results - page 20 / 66 » Fault emulation: a new approach to fault grading |
ITC
1997
IEEE
14 years 4 days ago
1997
IEEE
This paper presents a new approach for designing test sequences to be generated on–chip. The proposed technique is based on machine learning, and provides a way to generate effi...
ITC
1999
IEEE
14 years 6 days ago
1999
IEEE
This paper discusses practical issues involved in applying logic built-in self-test (BIST) to four large industrial designs. These multi-clock designs, ranging in size from 200K t...
KI
2004
Springer
14 years 1 months ago
2004
Springer
In this paper we present a new model of Java programs. We show how a program can be compiled into the model. The model can be directly used by a model-based diagnosis engine in ord...
DATE
1999
IEEE
14 years 7 days ago
1999
IEEE
The paper introduces the new concept of symmetric transparent BIST for RAMs. This concept allows to skip the signature prediction phase of conventional transparent BIST approaches...
ET
2007
13 years 7 months ago
2007
As new approaches and algorithms are developed for system diagnosis, it is important to reflect on existing approaches to determine their strengths and weaknesses. Of concern is i...