327 search results - page 57 / 66 » Fault emulation: a new approach to fault grading |
MSN
2007
Springer
14 years 2 months ago
2007
Springer
Some of the routing algorithms in mobile ad hoc networks use multiple paths simultaneously. These algorithms can attempt to find nodedisjoint paths to achieve higher fault toleranc...
GRID
2004
Springer
14 years 1 months ago
2004
Springer
With the advent of Grid computing, more and more highend computational resources become available for use to a scientist. While this opens up new avenues for scientific research,...
DATE
2010
IEEE
14 years 1 months ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
VLSID
1997
IEEE
14 years 3 days ago
1997
IEEE
—Logical initializability is the property of a gate-level circuit whereby it can be driven to a unique start state when simulated by a three-valued (0, 1, ) simulator. In practic...
EURODAC
1995
IEEE
13 years 11 months ago
1995
IEEE
: We present a new, dynamic algorithm for test sequence compaction and test cycle reduction for combinationaland sequential circuits. Several dynamic algorithms for compaction in c...