We present a fast, dynamic fault coverage estimation technique for sequential circuits that achieves high degrees of accuracy by signi cantly reducing the number of injected fault...
Although run-time reconfigurable systems have been shown to achieve very high performance, the speedups over traditional microprocessor systems are limited by the cost of configur...
Fault diagnosis is to predict the potential fault sites in a logic IC. In this paper, we particularly address the problem of diagnosing faults that exhibit the so-called Byzantine...
Abstract—Continuously shrinking feature sizes cause an increasing vulnerability of digital circuits. Manufacturing failures and transient faults may tamper the functionality. Aut...