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    DSE
    1998
    80views more  DSE 1998»
    The Voltan application programming environment for fail-silent processes
    13 years 7 months ago
    The Voltan application programming environment for fail-silent processes
    Download  www.cs.ncl.ac.uk
    The Voltan software library for building distributed applications provides the support for (i) a processpair to act as single Voltan self-checking ‘fail-silent’ process; and (...
    Dave Black, C. Low, Santosh K. Shrivastava
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    CSJM
    2006
    76views more  CSJM 2006»
    Graph Coloring using Peer-to-Peer Networks
    13 years 7 months ago
    Graph Coloring using Peer-to-Peer Networks
    Download  www.math.md
    The popularity of distributed file systems continues to grow in last years. The reasons they are preferred over traditional centralized systems include fault tolerance, availabili...
    Adrian Iftene, Cornelius Croitoru
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    IJNSEC
    2008
    126views more  IJNSEC 2008»
    A Hybrid Group Key Management Protocol for Reliable and Authenticated Rekeying
    13 years 7 months ago
    A Hybrid Group Key Management Protocol for Reliable and Authenticated Rekeying
    Download  ijns.femto.com.tw
    We present a hybrid group key management protocol that incorporates both a centralized and a contributory scheme for key management, and a tree-based Elliptic Curve Diffie-Hellman...
    Depeng Li, Srinivas Sampalli
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    EUROPAR
    2009
    Springer
    183views Distributed And Parallel Com...» more  EUROPAR 2009»
    Using Hybrid CPU-GPU Platforms to Accelerate the Computation of the Matrix Sign Function
    14 years 10 days ago
    Using Hybrid CPU-GPU Platforms to Accelerate the Computation of the Matrix Sign Function
    Download  www-user.tu-chemnitz.de
    Abstract. We investigate the performance of two approaches for matrix inversion based on Gaussian (LU factorization) and Gauss-Jordan eliminations. The target architecture is a cur...
    Peter Benner, Pablo Ezzatti, Enrique S. Quintana-O...
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    DAC
    2007
    ACM
    151views Computer Architecture» more  DAC 2007»
    Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
    14 years 8 months ago
    Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
    Download  www.gigascale.org
    Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
    Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
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